ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

Abstract

This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.

This work has been partially supported by the Spanish TEC2007-68072 project.

Peer reviewed

Original document

The different versions of the original document can be found in:

• http://hdl.handle.net/10261/83168

• http://link.springer.com/content/pdf/10.1007/s10836-009-5130-6.pdf,

http://link.springer.com/article/10.1007/s10836-009-5130-6/fulltext.html,

http://link.springer.com/content/pdf/10.1007/s10836-009-5130-6,

http://dx.doi.org/10.1007/s10836-009-5130-6 under the license http://www.springer.com/tdm

• http://xplorestaging.ieee.org/ielx5/5152931/5158680/05158686.pdf?arnumber=5158686,

http://dx.doi.org/10.1109/ims3tw.2009.5158686

• https://digital.csic.es/handle/10261/83168,

http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005158686,

https://ieeexplore.ieee.org/document/5158686,

https://academic.microsoft.com/#/detail/2132162057

• https://link.springer.com/article/10.1007/s10836-009-5130-6,

https://dblp.uni-trier.de/db/journals/et/et26.html#JalonP10,

https://rd.springer.com/article/10.1007/s10836-009-5130-6,

https://academic.microsoft.com/#/detail/2063724383

DOIS: 10.1007/s10836-009-5130-6 10.1109/ims3tw.2009.5158686