Abstract

Flow liquefaction is observed in saturated or nearly saturated geomaterials, showing a strain-softening response during undrained shear, primarily in very loose sands and silts, as well as in very sensitive clays. The Cone Penetration Test (CPTu) has been gaining popularity among the geotechnical community to evaluate the state of a soil profile due to its good repeatability, detailed information on the soil stratigraphy and extensive detailed scientific studies to guide the application of the test results. Susceptibility to flow liquefaction is typically evaluated by estimating the in-situ state parameter (𝜓) since it directly correlates to the soil behaviour at large strain, as shown by Jefferies & Been (2016). Mayne & Sharp (2019) suggested using the yield-stress-ratio (YSR = σp’/σv0’) to estimate the soil state using a threshold of YSR ≈ 3. Currently, in the Brazilian Mining Industry, it is common to find the application of different approaches to evaluating the susceptibility of mining tailings to flow liquefaction (e.g., Plewes et al., 1992; Olson, 2001; Shuttle & Cunning, 2008; Robertson, 2016). This paper presents an evaluation of the susceptibility of an iron ore tailings (IOTs) to flow liquefaction using the following recently published approaches: i) Mayne and Sharp (2019), using the yield stress ratio (YSR) approach; ii) Smith et al. (2021), using a generalised CPTu state parameter inversion method based on the NorSand Widget; and iii) Robertson (2022), with the updated Kc. The main results show a good convergence between the three methodologies used.

Full Paper

The PDF file did not load properly or your web browser does not support viewing PDF files. Download directly to your device: Download PDF document
Back to Top

Document information

Published on 07/06/24
Submitted on 07/06/24

Volume Geotechnical characterization of mine tailings, 2024
DOI: 10.23967/isc.2024.193
Licence: CC BY-NC-SA license

Document Score

0

Views 0
Recommendations 0

Share this document

claim authorship

Are you one of the authors of this document?